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Publicaciones |
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Luís Carlos Altamirano and Leopoldo Altamirano and Matías Alvarado., Non-uniform sampling for improved appearance-based models, Pattern Recognition Letters, 24:521-535, 2003. |
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A.B. Flores, L. A. Robles, J.A. Ascencio, M.O. Arias and Micron, Small metal nanoparticle recognition using digital image analysis and high resolution electron microscopy, Elsevier Journal, 34:109-118, 2003. |
Luis Enrique Erro #1, Tonantzintla, Puebla, México | Teléfono: (222) 266.31.00 | Contacto: robles@inaoep.mx | Fax: 247.25.80
Copyright © 2015 Laboratorio de Visión por Computadora
Copyright © 2015 Laboratorio de Visión por Computadora
